The MCM-S02ABS assembly serves as a carrier card for the two nAW1 modules Inductive and Digital to incremental signal conditioning.
Carrier card for nAW1 modules
- ECU Testing / HiL Systems
- Endurance testing / EOL tests
- Test bench measurement and control technology
- Rapid prototyping applications
- Evaluation module for inductive (mod_ind):
- 1 differential signal input
- Input amplitude 60mV to 50 Vrms
- Input frequency 120 kHz
- Evaluation module for incremental encoders (mod_dig):
- 3 differential signal traces
- Input frequency 300 kHz depending on the version or 1.5MHz
In cooperation with SMART TESTSOLUTIONS, ZF has developed a new generation of test stands that is characterised by exceptional flexibility and is easy to configure thanks to a lean script language and special drivers. In developing the system, the partners were able to draw on the existing range of optimised system modules for measured value acquisition, load and sensor simulation, which had a positive impact on costs.
